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Numerical junction temperature calculation method for reliability evaluation of power semiconductors in power electronics converters
Xiao Du Xiong Du Jun Zhang Gaoxian Li
Vol. 21, No. 1, pp. 184-194, Jan. 2021
10.1007/s43236-020-00154-z
Vol. 21, No. 1, pp. 184-194, Jan. 2021
10.1007/s43236-020-00154-z
ISSN : 1598 - 2092
eISSN : 2093 - 4718